HV AD4 XCP Series 
HV AD4 XCP Series
Type HV AD4 XW4000
The HV AD4 XW4000 allows the precise investigation of high-frequency and very dynamic processes with measurement data rates of up to 4 MHz per channel. The measurement data is output directly via XCP-on-Ethernet.
The HV AD4 XW4000 measurement module is equipped with a 4-channel socket for HV-safe sensor cables. They are used to measure the voltage in HV components with a very high sampling rate of 4 MS/s.
The measurement data is output directly via the standard XCP-on-Ethernet protocol, making it easy to connect the measurement module directly to common measurement PCs.
The measurement module includes an internal XCP gateway that can be used to connect further CSM EtherCAT® measurement modules with a corresponding option. This simplifies the measurement setup if additional values are to be acquired.
With the help of the "Precision Time Protocol" (PTP - IEEE 1588), the HV AD4 XW4000 and CSM measurement modules connected to it can be precisely synchronized.
Other variants (e.g. smaller measurement ranges / measurement data rates) of the AD XCP MM series are also available on request and with the corresponding quantity.
| HV AD4 XW4000 | |
|---|---|
| Measurement inputs | 4 analog inputs |
| Measurement ranges | ±100, ±200, ±500, ±1,000 V (The measurement ranges of the analog inputs are set to ±2,000 V in order to be able to detect transient overvoltages) |
| Measurement data rate per channel | 1, 2, 5, 10, 20, 50, 100, 200, 500, 1,000, 2,000, 4,000 kHz |
| Measurement categories | |
| CAT 0 | 1,000 V |
| CAT II | 600 V |
| CAT III | 300 V |
| Operating conditions | |
| Nominal voltages | up to 1,000 V DC |
| Housing protection class | IP67 |
| Operating temperature range | -40 °C to +125 °C |
| Pollution degree | 4 |
| Designation | Slide Case Large (SCL) |
|---|---|
| HV AD4 XW4000 |
The HV AD4 XW4000 is particularly suitable for HV-safe voltage measurements in components with power semiconductors, such as inverters and converters. The high-frequency and very dynamic processes in such devices can be investigated in detail thanks to the high measurement data rate.
The robust housing design and technical features (e.g. the very low power consumption) allow use both under harsh conditions in road tests and in test bench environments.
